• DocumentCode
    768650
  • Title

    Getting More out of ITC

  • Author

    Gattiker, Anne

  • Author_Institution
    IBM Austin Research Lab
  • Volume
    23
  • Issue
    5
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    432
  • Lastpage
    432
  • Abstract
    A look at plans for the 2006 International Test Conference.
  • Keywords
    International Test Conference; Testing; International Test Conference;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.119
  • Filename
    1704740
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=768650