DocumentCode
768964
Title
Erbium-doped waveguide fabrication via reactive pulsed laser deposition of erbium-doped oxyfluoride-silicate glass
Author
Thomson, R.R. ; Bookey, H.T. ; Kar, A.K. ; Taghizadeh, M.R. ; Klini, A. ; Fotakis, C. ; Romano, F. ; Caricato, A.P. ; Martino, M. ; Shen, S. ; Jha, A.
Author_Institution
Sch. of Eng. & Phys. Sci., Heriot Watt Univ., Edinburgh, UK
Volume
41
Issue
25
fYear
2005
Firstpage
1376
Lastpage
1377
Abstract
Using reactive pulsed laser deposition, a thin film of erbium-doped oxyfluoride-silicate glass is deposited onto a fused silica substrate. Rib waveguides are fabricated from this film using reactive ion etching. The fabrication and characterisation of these waveguides are summarised. As a result of various characterisation experiments described here, it is concluded that close to stoichiometric transfer of material from the bulk to the film has been achieved. It is concluded, however, that strong quenching mechanisms are present in the film, significantly affecting the magnitude of the 4I132/→4I152/ transition fluorescence lifetime.
Keywords
erbium; optical fabrication; optical planar waveguides; pulsed laser deposition; radiation quenching; radiative lifetimes; rib waveguides; silicon compounds; sputter etching; stoichiometry; Er-doped oxyfluoride-silicate glass; fluorescence lifetime; fused silica substrate; reactive ion etching; reactive pulsed laser deposition; rib waveguides; stoichiometric transfer; strong quenching mechanisms; thin film; waveguide fabrication;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20053203
Filename
1561765
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