Title :
Signal denoising techniques for partial discharge measurements
Author :
Sriram, S. ; Nitin, S. ; Prabhu, K.M.M. ; Bastiaans, M.J.
Author_Institution :
Midas Commun. Technol. Pvt. Ltd., Chennai, India
Abstract :
One of the major challenges of on-site partial discharge (PD) measurements is the recovery of PD signals from a noisy environment. The different sources of noise include thermal or resistor noise added by the measuring circuit, and high-frequency sinusoidal signals that electromagnetically couple from radio broadcasts and/or carrier wave communications. Sophisticated methods are required to detect PD signals correctly. Fortunately, advances in analog-to-digital conversion (ADC) technology, and recent developments in digital signal processing (DSP) enable easy extraction of PD signals. This paper deals with the denoising of PD signals caused by corona discharges. Several techniques are investigated and employed on simulated as well as real PD data.
Keywords :
Wigner distribution; analogue-digital conversion; corona; digital signal processing chips; electromagnetic coupling; fast Fourier transforms; least squares approximations; matched filters; notch filters; partial discharge measurement; radio broadcasting; signal denoising; signal detection; signal sources; wavelet transforms; ADC; DSP; FFT; PD signal detection; PD signal recovery; Wigner-Ville distribution; analog-to-digital conversion technology; carrier wave communication; corona discharge; digital signal processing; electromagnetical coupling; fast Fourier transform; high-frequency sinusoidal signal; notch filtering; partial discharge measurement; radio broadcast; recursive least squares; resistor noise; short-time Fourier transform; signal denoising technique; thermal noise; wavelet transform; Circuit noise; Digital signal processing; Electromagnetic interference; Electromagnetic measurements; Partial discharge measurement; Partial discharges; Resistors; Signal denoising; Thermal resistance; Working environment noise;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2005.1561798