• DocumentCode
    76943
  • Title

    Optical Frequency-Detuned Heterodyne for Self-Referenced Measurement of Photodetectors

  • Author

    Shangjian Zhang ; Heng Wang ; Xinhai Zou ; Yali Zhang ; Rongguo Lu ; Heping Li ; Yong Liu

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    27
  • Issue
    9
  • fYear
    2015
  • fDate
    May1, 1 2015
  • Firstpage
    1014
  • Lastpage
    1017
  • Abstract
    A self-referenced frequency response measurement of high-speed photodetectors (PDs) is proposed and demonstrated based on optical frequency-detuned heterodyne method. Our method provides a narrow linewidth and wide-bandwidth optical stimulus consisting of acoustooptic frequency shifting and two-tone phase modulation in a Mach-Zehnder interferometer, and achieves the self-referenced frequency response measurement of high-speed PDs without the need for correcting the power variation of optical stimulus. Moreover, it allows multiplied measuring frequency range and avoids any bias drifting problem. Frequency responses are experimentally measured for a commercial PD, which agree well with the results obtained by the conventional methods.
  • Keywords
    Mach-Zehnder interferometers; acousto-optical effects; heterodyne detection; optical modulation; phase modulation; photodetectors; Mach-Zehnder interferometer; acoustooptic frequency shifting; high-speed photodetectors; narrow linewidth optical stimulus; optical frequency-detuned heterodyne method; power variation; self-referenced frequency response measurement; two-tone phase modulation; wide-bandwidth optical stimulus; Frequency measurement; Frequency modulation; High-speed optical techniques; Optical interferometry; Optical mixing; Optical modulation; Optical variables measurement; Frequency response; microwave photonic signal processing; optical heterodyning; photodetectors;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2015.2405253
  • Filename
    7047675