• DocumentCode
    769501
  • Title

    Automated photocurrent and bussing extraction for dose-rate rail span collapse simulations

  • Author

    Bhuva, B. ; Mehrotra, S. ; Massengill, L. ; Kerns, S.

  • Author_Institution
    Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
  • Volume
    37
  • Issue
    6
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    2104
  • Lastpage
    2109
  • Abstract
    A simulator capable of simulating rail span collapse from layout-level inputs was developed. The simulations require radiation-induced photocurrent partitioning among proximal physical collection regions and electrical contacts to the power distribution network. The simulation approach incorporates simple geometric rules for current division inside a contiguous region along with the automated extraction of the power distribution network. Experimental results to verify the current division algorithms are also presented. Pixel-plane and scan-line techniques used for the automated extraction of the power distribution network are described. For simulation of the circuit, a simulator using conjugate-gradient algorithms is used. A postsimulation processor maps the actual supply rails onto the layout itself for easy identification of critical subcircuits
  • Keywords
    VLSI; digital simulation; radiation hardening (electronics); VLSI; automated bussing extraction; automated extraction; automated photocurrent extraction; conjugate-gradient algorithms; current division algorithms; dose-rate rail span collapse simulations; electrical contacts; geometric rules for current division; identification of critical subcircuits; layout-level inputs; pixel plane techniques; postsimulation processor; power distribution network; proximal physical collection regions; radiation-induced photocurrent partitioning; scan-line techniques; Circuit simulation; Combinational circuits; Computational modeling; Computer simulation; Photoconductivity; Power systems; Predictive models; Rails; Shape; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.101236
  • Filename
    101236