Title :
Investigation of the properties of amorphous silicon flat-panel detectors suitable for real-time neutron imaging
Author :
Estermann, Mirko ; Dubois, Joe
Author_Institution :
Paul Scherrer Inst., Villigen, Switzerland
Abstract :
Recent developments of amorphous silicon flat-panel detectors have opened new possibilities in two-dimensional (2-D) X-ray and neutron imaging. This paper presents measured characteristics of this type of detector for neutron imaging.
Keywords :
X-ray imaging; neutron radiography; real-time systems; silicon radiation detectors; amorphous silicon flat-panel detectors; neutron radiography; real-time neutron imaging; two-dimensional X-ray imaging; Amorphous silicon; Image resolution; Neutrons; Optical imaging; Radiography; Readout electronics; Switches; X-ray detection; X-ray detectors; X-ray imaging; Amorphous silicon flat-panel; detector; neutron imaging; real-time imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.843674
