DocumentCode :
769721
Title :
Effects of Ar-ion Implantation Into Ni Thin Films
Author :
Gondoh, Y. ; Yamagata, K. ; Suezawa, Y.
Author_Institution :
Yokohama National Univ. Faculty of Engineering, Yokohama.
Volume :
2
Issue :
5
fYear :
1987
fDate :
5/1/1987 12:00:00 AM
Firstpage :
465
Lastpage :
466
Abstract :
The effect of implanting Ar+ ions into Ni films (as opposed to Fe films) on magnetic moment is discussed. The magnetic moment decreased gradually at doses of 1 × 1015 ions/cm2 or less and decreased suddenly beyond 3 × 1016 ions/cm2. These doses eventually reduce surface tension. Higher doses convert this internal stress back into surface tension. These results support the model that the formation of Ar bubbles generates new Ni interfaces and that this formation of interfaces decreases the Ni magnetic moment.
Keywords :
Amorphous materials; Argon; Chemical elements; Internal stresses; Iron; Magnetic films; Magnetic moments; Surface tension; Temperature; Transistors;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1987.4549492
Filename :
4549492
Link To Document :
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