• DocumentCode
    769725
  • Title

    GaInAs-GaInNAs-GaInAs intermediate layer structure for long wavelength lasers

  • Author

    Gouardes, E. ; Miyamoto, T. ; Kawaguchi, M. ; Kondo, K. ; Koyama, F. ; Iga, K.

  • Author_Institution
    Alcatel Corporate Res. Center, OPTO+, Marcoussis, France
  • Volume
    14
  • Issue
    7
  • fYear
    2002
  • fDate
    7/1/2002 12:00:00 AM
  • Firstpage
    896
  • Lastpage
    898
  • Abstract
    Proposes two new structures, the GaInAs-GaInNAs intermediate layer (IML) and the GaInN/sub x/As graded wells, which show better optical properties than the commonly used GaInNAs-GaAs rectangular quantum-wells. A 1240-nm emitting IML laser has been achieved with a low-threshold current density (200 A/cm/sup 2//well) and a relatively high characteristic temperature (T/sub o/=100 K). The IML structure is very promising for long wavelength GaAs-based laser applications.
  • Keywords
    III-V semiconductors; MOCVD; current density; gallium arsenide; gallium compounds; indium compounds; laser beams; photoluminescence; quantum well lasers; 100 K; 1240 nm; GaInAs-GaInNAs; GaInAs-GaInNAs intermediate layer; GaInAs-GaInNAs-GaInAs; GaInN/sub x/As; GaInN/sub x/As graded wells; characteristic temperature; intermediate layer laser; intermediate layer structure; long wavelength GaAs-based laser applications; long wavelength lasers; low-threshold current density; optical properties; rectangular quantum-wells; Chemical lasers; Degradation; Gallium arsenide; MOCVD; Molecular beam epitaxial growth; Nitrogen; Photoluminescence; Quantum well lasers; Temperature; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2002.1012377
  • Filename
    1012377