DocumentCode :
769853
Title :
InP-InGaAsP high-speed traveling-wave electroabsorption modulators with integrated termination resistors
Author :
Irmscher, S. ; Lewen, R. ; Eriksson, U.
Author_Institution :
Lab. of Photonics & Microwave Eng., R. Inst. of Technol., Kista, Sweden
Volume :
14
Issue :
7
fYear :
2002
fDate :
7/1/2002 12:00:00 AM
Firstpage :
923
Lastpage :
925
Abstract :
Traveling-wave electroabsorption modulators for operation at 1.55 μm have been designed and fabricated. Devices of different lengths were characterized. Modulators with integrated termination resistors showed wide modulation bandwidths and excellent bandwidth-length products. A bandwidth of 43 GHz was measured for a 450-μm-long device, which corresponds to a 19.3-GHz/spl middot/mm bandwidth length product. For a device length of 250 μm, a bandwidth of 67 GHz is extrapolated from measurements up to 45 GHz.
Keywords :
III-V semiconductors; electro-optical modulation; electroabsorption; gallium arsenide; gallium compounds; indium compounds; optical communication equipment; optical design techniques; optical fabrication; resistors; 1.55 micron; 250 micron; 43 GHz; 450 micron; 67 GHz; InP-InGaAsP; InP-InGaAsP high-speed traveling-wave electroabsorption modulators; bandwidth-length products; integrated termination resistors; modulation bandwidths; optical design; optical fabrication; Bandwidth; High speed optical techniques; Impedance; Indium phosphide; Length measurement; Optical losses; Optical modulation; Optical resonators; Optical waveguides; Resistors;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2002.1012386
Filename :
1012386
Link To Document :
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