Phase error measurement of an arrayed-waveguide grating in the 1.3-μm wavelength region by optical low coherence interferometry

Author

Takada, K.

Author_Institution

NTT Photonics Labs., Ibaraki, Japan

Volume

14

Issue

7

fYear

2002

fDate

7/1/2002 12:00:00 AM

Firstpage

965

Lastpage

967

Abstract

This letter reports a method for generating transistor-transistor logic clock pulses at equal intervals of one quarter of the reference laser wavelength as the optical path difference between two arms of a Mach-Zehnder interferometer increases. With this technique, the phase error of an arrayed-waveguide grating operating in the 1.3-μm band can be measured precisely with optical low coherence interferometry using a tunable laser at 1.5 μm as the reference light source.

Keywords

Mach-Zehnder interferometers; diffraction gratings; laser tuning; light interferometry; measurement errors; optical arrays; optical communication equipment; optical pulse generation; optical testing; optical waveguides; transistor-transistor logic; wavelength division multiplexing; 1.3 micron; 1.5 micron; Mach-Zehnder interferometer; WDM; arrayed-waveguide grating; equal intervals; optical low coherence interferometry; optical path difference; optical planar waveguides; phase error; phase error measurement; reference laser wavelength; reference light source; transistor-transistor logic clock pulses; tunable laser; Arm; Clocks; Gratings; Logic; Optical arrays; Optical interferometry; Optical pulse generation; Phase measurement; Phased arrays; Wavelength measurement;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2002.1012400

Filename

1012400