Title :
Evaluation of Switching Performance of SiC Devices in PWM Inverter-Fed Induction Motor Drives
Author :
Zheyu Zhang ; Wang, Fred ; Tolbert, Leon M. ; Blalock, Benjamin J. ; Costinett, Daniel J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
Abstract :
Double pulse test (DPT) is a widely accepted method to evaluate the switching characteristics of semiconductor switches, including SiC devices. However, the observed switching performance of SiC devices in a PWM inverter for induction motor drives is almost always worse than the DPT characterization, with slower switching speed, more switching losses, and more serious parasitic ringing. This paper systematically investigates the factors that limit the SiC switching performance from both the motor side and inverter side, including the load characteristics of induction motor and power cable, two more phase legs for the three-phase PWM inverter in comparison with the DPT, and the parasitic capacitive coupling effect between power devices and heat sink. Based on a three-phase PWM inverter with 1200 V SiC MOSFETs, test results show that the induction motor, especially with a relatively long power cable, will significantly impact the switching performance, leading to a switching time increase by a factor of 2, switching loss increase up to 30% in comparison with that yielded from DPT, and serious parasitic ringing with 1.5 μs duration, which is more than 50 times of the corresponding switching time. In addition, the interactions among the three phase legs cannot be ignored unless the decoupling capacitors are mounted close to each phase leg to support the dc bus voltage during switching transients. Also, the coupling capacitance due to the heat sink equivalently increases the junction capacitance of power devices; however, its influence on the switching behavior in the motor drives is small considering the relatively large capacitance of the motor load.
Keywords :
PWM invertors; capacitors; heat sinks; induction motor drives; machine testing; power MOSFET; power cable testing; semiconductor device testing; silicon compounds; switching convertors; switching transients; wide band gap semiconductors; DC bus voltage; DPT characterization; SiC; coupling capacitance; decoupling capacitor; double pulse testing; heat sink; junction capacitance; load characteristics; parasitic capacitive coupling effect; parasitic ringing; power cable; power device; semiconductor switch; switching performance; switching transient; three-phase PWM inverter-fed induction motor drive; time 1.5 mus; voltage 1200 V; Impedance; Induction motors; Inverters; Performance evaluation; Power cables; Silicon carbide; Switches; Motor Drives; Motor drives; SiC Devices; SiC devices; Switching Performance; switching performance;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2014.2375827