Abstract :
The following topics are dealt with: basic mechanisms of radiation effects, dosimetry and energy dependent effects, hardness assurance and testing techniques, single-event upset and latchup, isolation techniques, device and integrated circuit effects and hardening, and spacecraft charging and electromagnetic effects
Keywords :
dosimetry; integrated circuit technology; radiation effects; radiation hardening (electronics); semiconductor technology; space vehicles; dosimetry; electromagnetic effects; energy dependent effects; hardness assurance; integrated circuit effects; isolation techniques; latchup; radiation effects; single-event upset; spacecraft charging; testing techniques;
