DocumentCode
770409
Title
Theory of ballistic nanotransistors
Author
Rahman, Anisur ; Guo, Jing ; Datta, Supriyo ; Lundstrom, Mark S.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
50
Issue
9
fYear
2003
Firstpage
1853
Lastpage
1864
Abstract
Numerical simulations are used to guide the development of a simple analytical theory for ballistic field-effect transistors. When two-dimensional (2-D) electrostatic effects are small (and when the insulator capacitance is much less than the semiconductor (quantum) capacitance), the model reduces to Natori´s theory of the ballistic MOSFET. The model also treats 2-D electrostatics and the quantum capacitance limit where the semiconductor quantum capacitance is much less than the insulator capacitance. This new model provides insights into the performance of MOSFETs near the scaling limit and a unified framework for assessing and comparing a variety of novel transistors.
Keywords
MOSFET; capacitance; carbon nanotubes; electrostatics; molecular electronics; nanoelectronics; nanotube devices; quantum theory; semiconductor device models; silicon; 2D electrostatic effects; C; CNTFET technology; Si; analytical theory; ballistic FETs; ballistic MOSFET; ballistic field-effect transistors; ballistic nanotransistors; carbon nanotube FETs; double-gate MOSFETs; insulator capacitance; molecular transistor; numerical simulations; quantum capacitance limit; scaling limit; semiconductor quantum capacitance; two-dimensional electrostatic effects; ultra-thin body; Analytical models; Electrostatics; FETs; Insulation; MOSFET circuits; Numerical simulation; Quantum capacitance; Semiconductor materials; Transistors; Two dimensional displays;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2003.815366
Filename
1224486
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