Title :
Advances in the development of encapsulants for mercuric iodide X-ray detectors
Author :
Iwanczyk, J.S. ; Wang, Y.J. ; Bradley, J.G. ; Albee, A.L. ; Schnepple, W.F.
Author_Institution :
Xsirus Inc., Marina del Ray, CA, USA
fDate :
12/1/1990 12:00:00 AM
Abstract :
Advances in the development of protective impermeable encapsulants with high transparency to ultra-low-energy X-rays for use on HgI2 X-ray detectors are reported. Various X-ray fluorescence spectra from coated detectors are presented. The X-ray absorption in the encapsulants has been analyzed using characteristic radiation from various elements. Results suggest that low-energy cutoffs for the detectors are not determined solely by the encapsulating coatings presently employed but are also influenced by the front electrode and surface effects, which can affect the local electric field or the surface recombination velocity. An energy resolution of 182 eV (FWHM) has been achieved for Ni L lines at 850 eV. Improved detector sensitivity to X-ray energies under 700 eV is demonstrated
Keywords :
X-ray emission spectra; X-ray fluorescence analysis; lithium; semiconductor counters; 182 eV; 700 eV; HgI2; HgI2 X-ray detectors; L lines; Ni; X-ray absorption; X-ray fluorescence spectra; encapsulants; energy resolution; front electrode; high transparency; sensitivity; surface effects; surface recombination velocity; ultra-low-energy X-rays; Attenuation; Coatings; Electrodes; Electromagnetic wave absorption; Encapsulation; Fluorescence; Marine technology; Protection; X-ray detection; X-ray detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
