Title :
An improved correlated double sampling circuit for low noise charge coupled devices
Author :
Wey, H.M. ; Guggenbühl, W.
Author_Institution :
Inst. fuer Elecktronik, ETH-Zentrum, Zurich, Switzerland
fDate :
12/1/1990 12:00:00 AM
Abstract :
Correlated double sampling (CDS) is discussed as a signal processing method to reduce low-frequency amplifier noise and kTC noise of sampled systems. The different noise contributions in a typical CCD output stage and their transformation through a CDS circuit are discussed. An improved CDS method (CDS2) is presented that completely eliminates the pixel crosstalk and kTC-noise contribution, but maintains a low noise bandwidth. The noise reduction achieved with the method lies in the range of 3-8 dB, with the lower limit valid for white noise and the upper limit for pixel crosstalk and kTC noise. The improved CDS circuit approaches optimum filtering of the combined noise spectrum. From the hardware point of view only one additional switch is required. Measured values with an experimental CCD output stage and CDS setup are shown to confirm the theory
Keywords :
CCD image sensors; correlation methods; crosstalk; interference suppression; picture processing; random noise; signal processing equipment; CCD output stage; LF noise reduction; charge coupled devices; combined noise spectrum; correlated double sampling circuit; kTC noise; low noise; low-frequency amplifier noise; optimum filtering; pixel crosstalk elimination; sampled systems; signal processing method; white noise; Charge coupled devices; Circuit noise; Crosstalk; Low-frequency noise; Low-noise amplifiers; Noise reduction; Sampling methods; Signal processing; Signal sampling; Switches;
Journal_Title :
Circuits and Systems, IEEE Transactions on