DocumentCode
770592
Title
An improved correlated double sampling circuit for low noise charge coupled devices
Author
Wey, H.M. ; Guggenbühl, W.
Author_Institution
Inst. fuer Elecktronik, ETH-Zentrum, Zurich, Switzerland
Volume
37
Issue
12
fYear
1990
fDate
12/1/1990 12:00:00 AM
Firstpage
1559
Lastpage
1565
Abstract
Correlated double sampling (CDS) is discussed as a signal processing method to reduce low-frequency amplifier noise and kTC noise of sampled systems. The different noise contributions in a typical CCD output stage and their transformation through a CDS circuit are discussed. An improved CDS method (CDS2) is presented that completely eliminates the pixel crosstalk and kTC-noise contribution, but maintains a low noise bandwidth. The noise reduction achieved with the method lies in the range of 3-8 dB, with the lower limit valid for white noise and the upper limit for pixel crosstalk and kTC noise. The improved CDS circuit approaches optimum filtering of the combined noise spectrum. From the hardware point of view only one additional switch is required. Measured values with an experimental CCD output stage and CDS setup are shown to confirm the theory
Keywords
CCD image sensors; correlation methods; crosstalk; interference suppression; picture processing; random noise; signal processing equipment; CCD output stage; LF noise reduction; charge coupled devices; combined noise spectrum; correlated double sampling circuit; kTC noise; low noise; low-frequency amplifier noise; optimum filtering; pixel crosstalk elimination; sampled systems; signal processing method; white noise; Charge coupled devices; Circuit noise; Crosstalk; Low-frequency noise; Low-noise amplifiers; Noise reduction; Sampling methods; Signal processing; Signal sampling; Switches;
fLanguage
English
Journal_Title
Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0098-4094
Type
jour
DOI
10.1109/31.101279
Filename
101279
Link To Document