Title :
CMOS APS crosstalk characterization via a unique submicron scanning system
Author :
Shcherback, Igor ; Yadid-Pecht, Orly
Author_Institution :
VLSI Syst. Center, Ben Gurion Univ., Sheva, Israel
Abstract :
This work introduces a novel way for CMOS APS crosstalk (CTK) determination and prediction based on our unique Submicron Scanning System (SSS) measurements. It enables the crosstalk magnitude determination, the tracking of its main causes, and can be used as a predictive tool for design optimization. A pronounced crosstalk asymmetry within the array which was revealed by the measurements is analyzed and modeled. The result points out that CMOS APS crosstalk is mostly affected by the specific pixel architecture and the pixels arrangement within the array.
Keywords :
CMOS image sensors; crosstalk; integrated circuit measurement; integrated circuit modelling; photodiodes; CMOS APS crosstalk; CMOS active pixel sensor; crosstalk asymmetry; crosstalk characterization; crosstalk magnitude determination; design optimization; pixel architecture; point spread function; predictive tool; submicron scanning system; Annealing; Crosstalk; Electron traps; Grain boundaries; Grain size; Interface states; Semiconductor thin films; Silicon; Thin film transistors; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2003.815594
