Title :
Built-in test maturation concepts using test program set and relational database technologies
Author :
Sudolsky, Michael D.
Author_Institution :
C-17 Autom. Test Syst., McDonnell Douglas Aerosp., Long Beach, CA, USA
fDate :
3/1/1996 12:00:00 AM
Abstract :
Continual improvement of avionic built-in test (BIT) is critical to mission readiness and capability. This paper discusses how test program set (TPS) and relational database (RDB) technologies can be used for this purpose. Important aspects for continually improving avionic BIT and TPS operation are discussed
Keywords :
aircraft testing; automatic testing; military aircraft; relational databases; TPS operation; aircraft testing; avionic built-in test; military aircraft; mission readiness; relational database technologies; test maturation concepts; test program set; Aerospace electronics; Aerospace testing; Automatic testing; Built-in self-test; Circuit testing; Costs; Displays; Military aircraft; Relational databases; System testing;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
