• DocumentCode
    770931
  • Title

    Surface acoustic wave properties of proton-exchanged LiNbO/sub 3/ waveguides with SiO/sub 2/ film

  • Author

    Kao, Kuo-Sheng ; Cheng, Chien-Chuan ; Chung, Chung-Jen ; Chen, Ying-Chung

  • Author_Institution
    Tung-Fung Inst. of Technol., Kaohsiung, Taiwan
  • Volume
    52
  • Issue
    3
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    503
  • Lastpage
    506
  • Abstract
    Surface acoustic wave (SAW) properties of proton-exchanged (PE) z-cut lithium niobate (LiNbO/sub 3/) waveguides with silicon dioxide (SiO/sub 2/) film layers were investigated using octanoic acid. The distribution of hydrogen measured by secondary ion mass spectrometry (SIMS) showed a step-like profile, which was assumed to be equal to the waveguide depth (d). The SiO/sub 2/ film was deposited on z-cut LiNbO/sub 3/ waveguide by radio frequency (rf) magnetron sputtering. We investigated the important parameters for the design of SAW devices such as phase velocity (V/sub p/), insertion loss (IL) and temperature coefficient of frequency (TCF) by a network analyzer using thin-film aluminum interdigital transducer electrodes on the upper SiO/sub 2/ film surface. The experimental results showed that the V/sub p/ of SAW decreased slightly with the increase of h//spl lambda/, where h was the thickness of SiO/sub 2/ films and /spl lambda/ was the wavelength. The IL of SAW increased with increased h//spl lambda/. The TCF of SAW calculated from the frequency change of the output of SAW delay line showed an evident decrease with the increase of h//spl lambda/. The TCF for PE z-cut LiNbO/sub 3/ was measured to be about -54.72 ppm//spl deg/C at h//spl lambda/ = 0.08. It revealed that the SiO/sub 2/ films could compensate and improve the temperature stability as compared with the TCF of SAW on PE samples without SiO/sub 2/ film.
  • Keywords
    electrodes; hydrogen; interdigital transducers; ion exchange; lithium compounds; secondary ion mass spectra; silicon compounds; sputter deposition; surface acoustic waves; surface structure; waveguides; H; LiNbO/sub 3/; SiO/sub 2/; delay line; insertion loss; interdigital transducer electrodes; network analyzer; octanoic acid; phase velocity; proton-exchanged waveguides; radio frequency magnetron sputtering; secondary ion mass spectrometry; surface acoustic wave properties; temperature frequency coefficient; temperature stability; waveguide depth; Acoustic waveguides; Acoustic waves; Frequency; Hydrogen; Lithium niobate; Semiconductor films; Silicon compounds; Sputtering; Surface acoustic waves; Temperature;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2005.1417274
  • Filename
    1417274