DocumentCode :
771144
Title :
Advances in Semiconductor Detectors for Charged Particle Space Spectrometry
Author :
Friedland, S.S. ; Katzenstein, H.S. ; Ziemba, F.P.
Author_Institution :
Solid State Radiations, Inc. Los Angeles, California
Volume :
10
Issue :
1
fYear :
1963
Firstpage :
190
Lastpage :
201
Abstract :
Nuclear semiconductor detectors have been limited in their dynamic range of linearity of pulse height versus energy for charged particle spectrometry because of (1) the depth of the sensitive volume, (2) the thickness of any entrance window, and (3) the noise level of the detector-amplifier system. Consideration has been given to extend the range of sensitivity by increasing the volume of the detector by lithium ion drift compensation and to increase the sensitivity to lower energies by removing any entrance window and reducing the noise level of the detector and the amplifier.
Keywords :
Leak detection; Leakage current; Noise level; Radiation detectors; Semiconductor device noise; Semiconductor diodes; Semiconductor radiation detectors; Space charge; Spectroscopy; Surface resistance;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1963.4323261
Filename :
4323261
Link To Document :
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