Title :
Accurate modeling of line-defect photonic crystal waveguides
Author :
Sauvan, C. ; Lalanne, P. ; Rodier, J.C. ; Hugonin, J.P. ; Talneau, A.
Author_Institution :
Centre Nat. de la Recherche Scientifique, Univ. Paris Sud, Orsay, France
Abstract :
An accurate three-dimensional method to calculate the Bloch modes of photonic crystal (PhC) waveguides is proposed. Good agreement with available experimental and numerical data is obtained. The originality of the method lies in the fact that the Bloch modes are seen as the electromagnetic fields associated to the complex poles of an in-plane transversal scattering matrix. In comparison with previous approaches, the computational domain discretized is smaller and a higher accuracy for the losses of PhC waveguides is achieved.
Keywords :
electromagnetic field theory; light scattering; matrix algebra; optical losses; optical waveguide theory; photonic crystals; Bloch modes; accuracy; computational domain; electromagnetic fields; in-plane transversal scattering matrix; integrated optics; line-defect photonic crystal waveguides; photonic crystal waveguides; three-dimensional method; Electromagnetic waveguides; Etching; Optical attenuators; Optical computing; Optical losses; Optical scattering; Optical waveguides; Optical wavelength conversion; Photonic crystals; Transmission line matrix methods;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2003.816123
