• DocumentCode
    771619
  • Title

    Effects of Simulated Transit Radiation on Digital Circuits

  • Author

    Courtois, Donald A.

  • Author_Institution
    Bendix Systems Division the Bendix Corporation Ann Arbor, Michigan
  • Volume
    10
  • Issue
    5
  • fYear
    1963
  • Firstpage
    87
  • Lastpage
    92
  • Abstract
    This paper describes results of tests made to determine the performance of digital computer circuits in a transit radiation environment. These tests were sponsored by the Bureau of Ships under direct cognizance of the Naval Radiological Defense Laboratory as part of a study of nuclear radiation effects on shipboard electronic equipment. The transit radiation is emitted by airborne weapon fission products after the fireball and cloud column have dispersed. The transit radiation was simulated by use of cobalt-60 gamma radiation to a maximum dose rate of 3 × 105 roentgens/ hour and to a maximum dose of 1.5 x 104 roentgens. The circuits tested consisted of conventional transistor digital circuitry with 11 to 32 components mounted on each printed wire card. A total of 72 cards of twelve types were actively tested using the manufacturer´s acceptance specifications as a basis for determining proper performance. Circuit performance was recorded by photographing the oscilloscope display of circuitwaveforms at regular intervals during a test. As a result of the radiation measurable changes occurred in the output waveforms of some of the circuits, but in no instance did the circuit performance become unacceptable because of the radiation.
  • Keywords
    Circuit optimization; Circuit simulation; Circuit testing; Computational modeling; Digital circuits; Electronic equipment; Electronic equipment testing; Laboratories; Marine vehicles; Radiation effects;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1963.4323308
  • Filename
    4323308