• DocumentCode
    771682
  • Title

    Mitigation of pattern-induced degradation in SOA-based all-optical OTDM demultiplexers by using RZ-DPSK modulation format

  • Author

    Chan, Kit ; Chan, Chun-Kit ; Chen, Lian Kuan ; Tong, Frank

  • Author_Institution
    Dept. of Inf. Eng., Chinese Univ. of Hong Kong, China
  • Volume
    15
  • Issue
    9
  • fYear
    2003
  • Firstpage
    1264
  • Lastpage
    1266
  • Abstract
    In this letter, we propose and demonstrate to employ return-to-zero differential phase-shifted-keying (RZ-DPSK) modulation format in optical time-division-multiplexing (OTDM) systems so as to mitigate the pattern-induced degradation in semiconductor optical amplifier-based all-optical demultiplexers. Experimental results prove that RZ-DPSK can effectively alleviate such impairment with negligible induced power penalty, and thus, is more robust than the conventional RZ ON-OFF keying modulation format in OTDM systems.
  • Keywords
    demultiplexing equipment; differential phase shift keying; optical communication equipment; semiconductor optical amplifiers; time division multiplexing; OTDM systems; RZ ON-OFF keying modulation format; RZ-DPSK modulation format; SOA-based all-optical OTDM demultiplexers; negligible induced power penalty; optical time-division-multiplexing; pattern-induced degradation; return-to-zero differential phase-shifted-keying modulation format; semiconductor optical amplifier-based all-optical demultiplexers; Degradation; Fiber nonlinear optics; High speed optical techniques; Nonlinear optics; Optical crosstalk; Optical interferometry; Optical modulation; Pulse modulation; Semiconductor optical amplifiers; Ultrafast optics;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2003.816701
  • Filename
    1224600