Title :
Mitigation of pattern-induced degradation in SOA-based all-optical OTDM demultiplexers by using RZ-DPSK modulation format
Author :
Chan, Kit ; Chan, Chun-Kit ; Chen, Lian Kuan ; Tong, Frank
Author_Institution :
Dept. of Inf. Eng., Chinese Univ. of Hong Kong, China
Abstract :
In this letter, we propose and demonstrate to employ return-to-zero differential phase-shifted-keying (RZ-DPSK) modulation format in optical time-division-multiplexing (OTDM) systems so as to mitigate the pattern-induced degradation in semiconductor optical amplifier-based all-optical demultiplexers. Experimental results prove that RZ-DPSK can effectively alleviate such impairment with negligible induced power penalty, and thus, is more robust than the conventional RZ ON-OFF keying modulation format in OTDM systems.
Keywords :
demultiplexing equipment; differential phase shift keying; optical communication equipment; semiconductor optical amplifiers; time division multiplexing; OTDM systems; RZ ON-OFF keying modulation format; RZ-DPSK modulation format; SOA-based all-optical OTDM demultiplexers; negligible induced power penalty; optical time-division-multiplexing; pattern-induced degradation; return-to-zero differential phase-shifted-keying modulation format; semiconductor optical amplifier-based all-optical demultiplexers; Degradation; Fiber nonlinear optics; High speed optical techniques; Nonlinear optics; Optical crosstalk; Optical interferometry; Optical modulation; Pulse modulation; Semiconductor optical amplifiers; Ultrafast optics;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2003.816701