DocumentCode
771682
Title
Mitigation of pattern-induced degradation in SOA-based all-optical OTDM demultiplexers by using RZ-DPSK modulation format
Author
Chan, Kit ; Chan, Chun-Kit ; Chen, Lian Kuan ; Tong, Frank
Author_Institution
Dept. of Inf. Eng., Chinese Univ. of Hong Kong, China
Volume
15
Issue
9
fYear
2003
Firstpage
1264
Lastpage
1266
Abstract
In this letter, we propose and demonstrate to employ return-to-zero differential phase-shifted-keying (RZ-DPSK) modulation format in optical time-division-multiplexing (OTDM) systems so as to mitigate the pattern-induced degradation in semiconductor optical amplifier-based all-optical demultiplexers. Experimental results prove that RZ-DPSK can effectively alleviate such impairment with negligible induced power penalty, and thus, is more robust than the conventional RZ ON-OFF keying modulation format in OTDM systems.
Keywords
demultiplexing equipment; differential phase shift keying; optical communication equipment; semiconductor optical amplifiers; time division multiplexing; OTDM systems; RZ ON-OFF keying modulation format; RZ-DPSK modulation format; SOA-based all-optical OTDM demultiplexers; negligible induced power penalty; optical time-division-multiplexing; pattern-induced degradation; return-to-zero differential phase-shifted-keying modulation format; semiconductor optical amplifier-based all-optical demultiplexers; Degradation; Fiber nonlinear optics; High speed optical techniques; Nonlinear optics; Optical crosstalk; Optical interferometry; Optical modulation; Pulse modulation; Semiconductor optical amplifiers; Ultrafast optics;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2003.816701
Filename
1224600
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