DocumentCode
771870
Title
Characteristic of charge accumulation in glass materials under electron beam irradiation
Author
Miyake, Hiroaki ; Tanaka, Yasuhiro ; Takada, Tatsuo
Author_Institution
Electron. Meas. Lab., Musashi Inst. of Technol., Tokyo
Volume
14
Issue
2
fYear
2007
fDate
4/1/2007 12:00:00 AM
Firstpage
520
Lastpage
528
Abstract
Space charge formation in various glass materials under electron beam irradiation was investigated. The charging of spacecrafts occurs in plasma and radiation environments. In particular, we focused on an accident caused by internal charging in a glass material that was used as the cover plate of a solar panel array, and tried to measure the charge distribution in glass materials under electron beam irradiation using a pulsed electroacoustic (PEA) method. In the case of quartz glass (pure SiO2), no charge accumulation was observed either during or after the electron beam irradiation. On the contrary, charge accumulation was observed in glass samples containing metal oxide impurities. It is found that the polarity of the observed charges depends on the contents of the impurities. To identify which impurity dominates the polarity of the accumulated charge, we measured charge distributions in several glass materials containing various metal oxide impurities. Furthermore, the dependence of the polarity of accumulated charges on the composition of glass materials is discussed using energy band models
Keywords
accumulation layers; electron beam applications; glass; pulsed electroacoustic methods; space charge; PEA; charge accumulation; charge distribution; electron beam irradiation; energy band model; glass materials; pulsed electroacoustic method; solar panel array; space charge formation; Aircraft manufacture; Charge measurement; Current measurement; Electron beams; Glass; Impurities; Plasma measurements; Plasma properties; Pulse measurements; Space charge;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2007.344634
Filename
4150622
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