• DocumentCode
    771870
  • Title

    Characteristic of charge accumulation in glass materials under electron beam irradiation

  • Author

    Miyake, Hiroaki ; Tanaka, Yasuhiro ; Takada, Tatsuo

  • Author_Institution
    Electron. Meas. Lab., Musashi Inst. of Technol., Tokyo
  • Volume
    14
  • Issue
    2
  • fYear
    2007
  • fDate
    4/1/2007 12:00:00 AM
  • Firstpage
    520
  • Lastpage
    528
  • Abstract
    Space charge formation in various glass materials under electron beam irradiation was investigated. The charging of spacecrafts occurs in plasma and radiation environments. In particular, we focused on an accident caused by internal charging in a glass material that was used as the cover plate of a solar panel array, and tried to measure the charge distribution in glass materials under electron beam irradiation using a pulsed electroacoustic (PEA) method. In the case of quartz glass (pure SiO2), no charge accumulation was observed either during or after the electron beam irradiation. On the contrary, charge accumulation was observed in glass samples containing metal oxide impurities. It is found that the polarity of the observed charges depends on the contents of the impurities. To identify which impurity dominates the polarity of the accumulated charge, we measured charge distributions in several glass materials containing various metal oxide impurities. Furthermore, the dependence of the polarity of accumulated charges on the composition of glass materials is discussed using energy band models
  • Keywords
    accumulation layers; electron beam applications; glass; pulsed electroacoustic methods; space charge; PEA; charge accumulation; charge distribution; electron beam irradiation; energy band model; glass materials; pulsed electroacoustic method; solar panel array; space charge formation; Aircraft manufacture; Charge measurement; Current measurement; Electron beams; Glass; Impurities; Plasma measurements; Plasma properties; Pulse measurements; Space charge;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2007.344634
  • Filename
    4150622