• DocumentCode
    772084
  • Title

    Integration and characterization of amorphous silicon thin-film transistor and Mo-tips for active-matrix cathodes

  • Author

    Kim, Do-Hyung ; Song, Yoon-Ho ; Cho, Young-Rae ; Hwang, Chi-Sun ; Kim, Bong-Chul ; Ahn, Seong-Deok ; Chung, Choong-Heui ; Uhm, Hyun-Seok ; Lee, Jin Ho ; Cho, Kyung-Ik ; Lee, Sang-Yun

  • Author_Institution
    Dept. of Phys., Kyungpook Nat. Univ., Taegu, South Korea
  • Volume
    49
  • Issue
    7
  • fYear
    2002
  • fDate
    7/1/2002 12:00:00 AM
  • Firstpage
    1136
  • Lastpage
    1142
  • Abstract
    We have designed and monolithically integrated amorphous silicon thin-film transistor (a-Si TFT) with Mo-tip field emitter arrays (FEAs) on glass substrate for active-matrix cathodes (AMCs) in field-emission display (FED) application. In our AMCs, a light shield layer of metal was introduced to reduce the photo leakage and back channel currents of a-Si TFT. The light shield was designed to have the role of focusing grid to focus emitted electron beams from the AMC on the corresponding anode pixel by forming it around the Mo-tip FEAs as well as above the a-Si TFT. The thin film depositions in a-Si TFTs were performed at a high temperature of above 360°C to guarantee the postvacuum packaging process of cathode and anode plates in FED. Also, a novel wet etching process was developed for n+-doped-a-Si etching with high etch selectivity to intrinsic a-Si and good etch controllability and was used in the fabrication of inverted stagger TFT with a very thin active layer. The developed a-Si TFTs had good enough performance to be used as control devices for AMCs with Mo-tip emitters. The fabricated AMCs exhibited very effective aging process for field emitters
  • Keywords
    ageing; amorphous semiconductors; cathodes; elemental semiconductors; etching; leakage currents; semiconductor device packaging; silicon; thin film transistors; vacuum microelectronics; 360 degC; AMCs; Mo; S; active-matrix cathodes; aging process; anode pixel; back channel currents; emitted electron beams; etch controllability; etch selectivity; field emitter arrays; field-emission display application; inverted stagger TFT; light shield layer; photo leakage; postvacuum packaging process; thin-film transistor; wet etching process; Active matrix technology; Amorphous silicon; Anodes; Cathodes; Field emitter arrays; Glass; Semiconductor thin films; Substrates; Thin film transistors; Wet etching;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2002.1013268
  • Filename
    1013268