Title :
Extreme Value Analysis in Flash Memories for Dosimetry Applications
Author :
Savage, Mark W. ; Gadlage, M.J. ; Kay, M. ; Ingalls, J. David ; Duncan, A.
Author_Institution :
Crane Div., Naval Surface Warfare Center, Crane, IN, USA
Abstract :
A commercial off-the-shelf flash memory is repurposed for use as a dosimeter. Target theory is used to derive fitting curves, and the curves are used to derive the extreme value distribution. This extreme value distribution predicts when the first failures will occur, allowing low doses to be measured. Pre-exposing the DUT to a known dose will reduce the free charge on the floating gate. Combining both methodologies can reduce the sensitivity of the DUT to any level desired.
Keywords :
curve fitting; dosimetry; flash memories; radiation hardening (electronics); DUT; commercial off-the-shelf flash memory; curve fitting; dosimetry applications; extreme value analysis; extreme value distribution; floating gate; sensitivity reduction; target theory; Flash memories; Logic gates; Nonvolatile memory; Sensitivity; Statistical analysis; Extreme value analysis; flash memories; target theory; total ionizing dose (TID);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2287340
