DocumentCode
772219
Title
Suppression of InP substrate degradation by hydrogen plasma caused by the presence of phosphorus vapour
Author
Schutz, Roland ; Matsushita, Kazuki ; Hartnagel, H.L. ; Krawczyk, S.K.
Author_Institution
Inst. fur Hochfrequenztech., Tech. Hochschule Darmstadt, West Germany
Volume
26
Issue
9
fYear
1990
fDate
4/26/1990 12:00:00 AM
Firstpage
564
Lastpage
566
Abstract
It is demonstrated that the degradation of InP substrates in a hydrogen plasma can be prevented by the introduction of phosphorus vapour into the reaction chamber. The results obtained, using standard surface analysis techniques and photoluminescence depth profiling, indicate that the stoichiometry of the InP surface region can be preserved and the number of P-vacancies which diffuse into the bulk drastically reduced.
Keywords
III-V semiconductors; indium compounds; photoluminescence; plasma deposition; semiconductor technology; sputter etching; substrates; H plasma; II-V semiconductors; InP substrate; P vapour; PH 3; degradation suppression; photoluminescence depth profiling; standard surface analysis techniques; surface region stoichiometry; surface treatment;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19900369
Filename
48755
Link To Document