• DocumentCode
    772219
  • Title

    Suppression of InP substrate degradation by hydrogen plasma caused by the presence of phosphorus vapour

  • Author

    Schutz, Roland ; Matsushita, Kazuki ; Hartnagel, H.L. ; Krawczyk, S.K.

  • Author_Institution
    Inst. fur Hochfrequenztech., Tech. Hochschule Darmstadt, West Germany
  • Volume
    26
  • Issue
    9
  • fYear
    1990
  • fDate
    4/26/1990 12:00:00 AM
  • Firstpage
    564
  • Lastpage
    566
  • Abstract
    It is demonstrated that the degradation of InP substrates in a hydrogen plasma can be prevented by the introduction of phosphorus vapour into the reaction chamber. The results obtained, using standard surface analysis techniques and photoluminescence depth profiling, indicate that the stoichiometry of the InP surface region can be preserved and the number of P-vacancies which diffuse into the bulk drastically reduced.
  • Keywords
    III-V semiconductors; indium compounds; photoluminescence; plasma deposition; semiconductor technology; sputter etching; substrates; H plasma; II-V semiconductors; InP substrate; P vapour; PH 3; degradation suppression; photoluminescence depth profiling; standard surface analysis techniques; surface region stoichiometry; surface treatment;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19900369
  • Filename
    48755