Title :
Construction of a computer-aided measuring system for short-circuit testing
Author :
Yamashita, S. ; Kato, H. ; Ikeda, H. ; Ozawa, Y. ; Ohshima, I.
Author_Institution :
Toshiba Corp., Kawasaki, Japan
fDate :
7/1/1992 12:00:00 AM
Abstract :
A computer-aided measuring system was developed for a short-circuit testing laboratory, using a computer-aided oscilloscope and an optical signal transmission system. The algorithm for calculating the basic value was developed in order to improve the flexibility of the system, taking a real wave shape into account. A set of programs was made by combining basic value analyzing programs to satisfy a variety of tests and equipment conditions. A special analyzing function was introduced. Noise and accuracy problems in high-current testing are discussed
Keywords :
automatic test equipment; oscilloscopes; short-circuit currents; test facilities; accuracy; computer-aided measuring system; computer-aided oscilloscope; flexibility; noise; optical signal transmission system; short-circuit testing laboratory; Circuit breakers; Circuit testing; Fault diagnosis; Optical computing; Power measurement; Power system reliability; Samarium; Switches; System testing; Voltage;
Journal_Title :
Power Delivery, IEEE Transactions on
