Title :
Imaging of micro- and nano-structures with hard X-rays
Author :
Rau, C. ; Crecea, V. ; Richter, C.-P. ; Peterson, K.M. ; Jemian, P.R. ; Usler, U. Neuhä ; Schneider, G. ; Yu, X. ; Braun, P.V. ; Chiang, T.C. ; Robinson, I.K.
Author_Institution :
Frederick-Seitz Mater. Res. Lab., Univ. of Illinois, Urbana-Champaign, IL
fDate :
3/1/2007 12:00:00 AM
Abstract :
Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales
Keywords :
X-ray apparatus; X-ray microscopy; nanostructured materials; hard X-ray microscope; in-line phase contrast microimaging; microstructures; nanostructures; opaque samples; synchrotron radiation;
Journal_Title :
Micro & Nano Letters, IET
DOI :
10.1049/mnl:20065060
