DocumentCode :
772404
Title :
New technology for reduction in cost and size of silica guided-wave component
Author :
Imoto, Keisuke ; Hori, A.
Author_Institution :
Hitachi Cable Ltd., Ibaraki, Japan
Volume :
28
Issue :
17
fYear :
1992
Firstpage :
1665
Lastpage :
1667
Abstract :
A waveguide with SiOxNyHz core glass film and its fabrication method have been developed that can realise a high refractive index difference Delta to reduce the cost and size of the device. Delta can be increased by approximately 7% by controlling the nitrogen concentration. This SiOxNyHz film is deposited on a quartz glass substrate with a face down type of plasma CVD method. The warp of the substrate formed by SiOxNyHz core glass film is very small compared with that of conventional core glass film. The core side roughness on patterning of the core glass film in the dry-etching process is also very small. The plasma CVD method can suppress the growth of particles on the deposited film. A reduction in the cost and size of the guided-wave type component can be expected by using the SiOxNyHz core glass.
Keywords :
integrated optics; optical waveguides; optical workshop techniques; plasma CVD; refractive index; silicon compounds; N 2 content control; N 2O; SiH 4; SiO xN yH z core glass film; dry-etching process; fabrication method; face down type; patterning; plasma CVD method; quartz glass substrate; refractive index difference; silica guided-wave component;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19921059
Filename :
156317
Link To Document :
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