• DocumentCode
    772404
  • Title

    New technology for reduction in cost and size of silica guided-wave component

  • Author

    Imoto, Keisuke ; Hori, A.

  • Author_Institution
    Hitachi Cable Ltd., Ibaraki, Japan
  • Volume
    28
  • Issue
    17
  • fYear
    1992
  • Firstpage
    1665
  • Lastpage
    1667
  • Abstract
    A waveguide with SiOxNyHz core glass film and its fabrication method have been developed that can realise a high refractive index difference Delta to reduce the cost and size of the device. Delta can be increased by approximately 7% by controlling the nitrogen concentration. This SiOxNyHz film is deposited on a quartz glass substrate with a face down type of plasma CVD method. The warp of the substrate formed by SiOxNyHz core glass film is very small compared with that of conventional core glass film. The core side roughness on patterning of the core glass film in the dry-etching process is also very small. The plasma CVD method can suppress the growth of particles on the deposited film. A reduction in the cost and size of the guided-wave type component can be expected by using the SiOxNyHz core glass.
  • Keywords
    integrated optics; optical waveguides; optical workshop techniques; plasma CVD; refractive index; silicon compounds; N 2 content control; N 2O; SiH 4; SiO xN yH z core glass film; dry-etching process; fabrication method; face down type; patterning; plasma CVD method; quartz glass substrate; refractive index difference; silica guided-wave component;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19921059
  • Filename
    156317