Title :
Wavelet-Based Texture Features for the Classification of Age Classes in a Maritime Pine Forest
Author :
Regniers, O. ; Bombrun, L. ; Guyon, D. ; Samalens, J.-C. ; Germain, Cecile
Author_Institution :
IMS Lab., Univ. of Bordeaux, Talence, France
Abstract :
This letter evaluates the potential of wavelet-based texture modeling for the classification of stand age in a managed maritime pine forest using very high resolution panchromatic and multispectral PLEIADES data. A cross-validation approach based on stand age reference data is used to compare classification performances obtained from different multivariate models (multivariate Gaussian, spherically invariant random vector (SIRV)-based models, and Gaussian copulas) and from co-occurrence matrices. Results show that the multivariate modeling of the spatial dependence of wavelet coefficients (particularly when using the Gaussian SIRV model) outperforms the use of features derived from co-occurrence matrices. Simultaneously adding features representing the color dependence and leveling the dominant orientation in anisotropic forest stands enhances the classification performances. These results confirm the ability of such wavelet-based multivariate models to efficiently capture the textural properties of very high resolution forest data and open up perspectives for their use in the mapping of monospecific forest structure variables.
Keywords :
Gaussian processes; feature extraction; geophysical image processing; image classification; image resolution; image texture; vegetation mapping; Gaussian copulas; age classes; cooccurrence matrices; image classification; maritime pine forest; multispectral PLEIADES data; multivariate Gaussian model; spherically invariant random vector-based model; stand age reference data; very high resolution panchromatic data; wavelet-based texture modeling; Computational modeling; Data models; Feature extraction; Image color analysis; Spatial resolution; Vectors; Vegetation; Forest structure; image classification; image texture analysis; very high resolution; wavelet;
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
DOI :
10.1109/LGRS.2014.2353656