DocumentCode :
772566
Title :
Technology 1992-test and measurement
Author :
Riezenman, M.J.
Volume :
29
Issue :
1
fYear :
1992
fDate :
1/1/1992 12:00:00 AM
Firstpage :
45
Lastpage :
46
Abstract :
Noteworthy developments during 1991 are summarized. The rise of RISC put new demands on logic analyzers. Instruments relied less on PCs and more on multiple microprocessors for intelligence. Testability issues continued to grow in importance, with a strong focus on boundary scan methods. In the standards area, work continued on intrinsic, or quantum, standards, with ion cooling and laser trapping coming to the fore as promising techniques
Keywords :
measurement; testing; AD 1991; RISC; boundary scan methods; ion cooling; laser trapping; logic analyzers; measurement; multiple microprocessors; standards; testing; Atom optics; Circuit testing; Displays; Instruments; Microprocessors; Performance evaluation; Personal communication networks; Power engineering and energy; Spectral analysis; Standards organizations;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/6.109600
Filename :
109600
Link To Document :
بازگشت