Title :
An over-110-GHz InP HEMT flip-chip distributed baseband amplifier with inverted microstrip line structure for optical transmission system
Author :
Masuda, Satoshi ; Takahashi, Tsuyoshi ; Joshin, Kazukiyo
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
Abstract :
We successfully developed state-of-the-art InP high electron mobility transistor (HEMT) distributed amplifiers by using inverted microstrip line (IMSL) technology. The IMSL has minor frequency dispersion characteristics and a simple equivalent circuit model can embody its discontinuity, such as a T-junction, because it has a large ground plane at the surface of the chip. For one distributed amplifier, we achieved a gain of 14.5 dB and a 94-GHz 3-dB bandwidth resulting in a gain-bandwidth product of 500 GHz, and for the other we achieved a gain of 7.5 dB and a 3-dB bandwidth of over 110 GHz. Furthermore, this technology also offers the capability of fabricating ultra-broad-band packaged ICs with flip-chip assembly for operation up to the W-band. In this paper, we focus on the advantage of IMSL technology for circuit design. We used an IMSL structure to design and fabricate a distributed amplifier to verify the advantages of IMSL. Our results show that this is an accurate technique for designing broad-band circuits up to 110 GHz.
Keywords :
HEMT integrated circuits; III-V semiconductors; distributed amplifiers; equivalent circuits; flip-chip devices; indium compounds; microstrip circuits; microstrip discontinuities; optical communication equipment; wideband amplifiers; 110 GHz; 14.5 dB; 7.5 dB; 94 GHz; InP; InP HEMT distributed baseband amplifier; T-junction; W-band; circuit design; discontinuity; equivalent circuit model; fiber-optic communication; flip-chip assembly; frequency dispersion; gain-bandwidth product; inverted microstrip line technology; optical transmission system; ultra-broad-band IC; Bandwidth; Baseband; Distributed amplifiers; Gain; HEMTs; Indium phosphide; Microstrip; Optical amplifiers; Semiconductor optical amplifiers; Stimulated emission;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2003.815925