• DocumentCode
    772634
  • Title

    Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip

  • Author

    Hilleringmann, U. ; Goser, K.

  • Author_Institution
    Fac. of Electr. Eng., Dortmund Univ., Germany
  • Volume
    42
  • Issue
    5
  • fYear
    1995
  • fDate
    5/1/1995 12:00:00 AM
  • Firstpage
    841
  • Lastpage
    846
  • Abstract
    Optical waveguides, photodetectors, and VLSI CMOS circuits are integrated monolithically in different ways: in a combined integration technique the light-guiding film is deposited and covered with a SiO2 layer replacing standard PSG as the dielectric insulation of polysilicon and metallization. In a stacked method the waveguide fabrication starts after metallization and test of the CMOS circuits. Electrooptical coupling is performed by butt-, leaky wave-, or, mirror-coupling of waveguides and photodetectors. To fabricate the system, SWAMI LOCOS technique is applied for monolithic integration of both, integrated optical devices, and microelectronic circuits. This paper discusses the integration technology and the results of static and dynamic measurements
  • Keywords
    CMOS integrated circuits; VLSI; elemental semiconductors; integrated circuit technology; integrated optoelectronics; optical waveguides; photodetectors; phototransistors; silicon; OEIC; SWAMI LOCOS technique; Si; SiO2; SiO2 layer; VLSI CMOS circuits; butt-coupling; dielectric insulation; electrooptical coupling; integrated optical devices; leaky wave-coupling; light-guiding film; microelectronic circuits; mirror-coupling; monolithic integration; optical waveguides; optoelectronic system integration; photodetectors; stacked method; waveguide fabrication; Circuit testing; Dielectrics and electrical insulation; Integrated circuit metallization; Integrated optics; Optical device fabrication; Optical films; Optical waveguides; Photodetectors; Silicon; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.381978
  • Filename
    381978