• DocumentCode
    772741
  • Title

    Semiconductor Lithium-Ion Drift Diodes as High-Resolution Gamma-Ray Pair Spectrometers

  • Author

    Tavendale, A.J.

  • Author_Institution
    Physics Division, Chalk River Nuclear Laboratories, Atomic Energy of Canada Limited
  • Volume
    11
  • Issue
    3
  • fYear
    1964
  • fDate
    6/1/1964 12:00:00 AM
  • Firstpage
    191
  • Lastpage
    200
  • Abstract
    Germanium and silicon p-i-n diodes with active volumes up to 2 cm3 have been fabricated using the lithium-ion drift technique. p-type germanium doped with either gallium or zinc (5-10 ohm-cm) and boron-doped silicon (1100 ohm-cm) were the base materials. Diodes were operated at 77°K in conjunction with a low noise amplifier system (270 RMS electron-holes). They have been used as gamma-ray pair spectrometers, germanium diodes giving a resolution of 7 keV (FWHM) at 2.75 MeV gamma-ray energy increasing to 10 keV at 7.64 MeV; resolution from a silicon device was slightly inferior. A germanium diode has been used as the central detector in a triple-crystal pair spectrometer incorporating two NaI scintillators. This arrangement improved the ratio of the height of the pair peak to the background below the peak from 7:1 to 150:1 for 2.75 MeV gamma-rays from a Na24 source.
  • Keywords
    Energy resolution; Germanium; III-V semiconductor materials; P-i-n diodes; Semiconductor device noise; Semiconductor diodes; Semiconductor materials; Silicon; Spectroscopy; Zinc;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1964.4323422
  • Filename
    4323422