DocumentCode :
772748
Title :
Heavy Particle Radiation Damage Effects in Lithium Drifted Silicon Detectors
Author :
Mann, Harry M. ; Yntema, Jan L.
Author_Institution :
Electronics Division
Volume :
11
Issue :
3
fYear :
1964
fDate :
6/1/1964 12:00:00 AM
Firstpage :
201
Lastpage :
205
Abstract :
Deterioration of charged-particle resolution-width, for p-i-n detectors prepared by lithiumion-drift techniques, was observed during bombardment with protons, and alpha particles. During exposure the resolution-width increased without loss of rectification when damage was confined to the intrinsic region. Significant deterioration in response was observed for 108 particles/cm2. Rapid loss of rectification was observed during exposure to neutrons at energies mostly in the range of from 1 to 10 MeV and for a flux of 109 neutrons/cm2/sec. The damage effects were studied with several detectors having an electron resolution-width of 15 to 20 keV at room temperature, and a window thickness of approximately 1 mg/cm2. Limitations on recovery, by further drift treatment, were observed for an integrated charged-particle flux in excess of 1012 particles/cm2. The response of these detectors to electrons before and after damage, and to heavy charged particles during production of damage and after recovery, is described.
Keywords :
Alpha particles; Electrons; Lithium; Neutrons; PIN photodiodes; Particle production; Protons; Radiation detectors; Silicon radiation detectors; Temperature;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1964.4323423
Filename :
4323423
Link To Document :
بازگشت