DocumentCode
772768
Title
Influence of material parameters on acoustic wave propagation modes in ZnO/Si bi-layered structures
Author
Gao, Hui-dong ; Zhang, Shu-yi ; Qi, Xue ; Wasa, Kiyotaka ; Wu, Hao-dong
Author_Institution
Lab. of Modern Acoust., Nanjing Univ., China
Volume
52
Issue
12
fYear
2005
Firstpage
2361
Lastpage
2369
Abstract
The influences of material properties on acoustic wave propagation modes in ZnO/Si bi-layered structures are studied. The transfer matrix method is used to calculate dispersion relations, wave field distributions, and electromechanical coupling coefficients of acoustic wave propagation modes in ZnO/Si bi-layered systems, in which the thickness of the substrate is of the same order of magnitude as the wavelength of the propagating wave modes. The influences of the thin film parameters on the acoustic wave propagation modes and their electromechanical coupling coefficients of the wave modes also are obtained. In addition, some experimental results for characterizing the wave propagation modes and their frequencies have also been obtained, which agree well with the theoretical predictions.
Keywords
II-VI semiconductors; acoustic wave effects; elemental semiconductors; piezoelectric semiconductors; piezoelectric thin films; piezoelectricity; silicon; transfer function matrices; zinc compounds; Si; ZnO-Si; acoustic wave propagation modes; bilayered structures; dispersion relations; electromechanical coupling coefficients; transfer matrix method; wave field distributions; Acoustic materials; Acoustic propagation; Acoustic waves; Dispersion; Frequency; Micromechanical devices; Piezoelectric films; Substrates; Transistors; Zinc oxide; Acoustics; Computer Simulation; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Materials Testing; Models, Chemical; Radiation Dosage; Radiometry; Silicon; Transducers; Ultrasonography; Zinc Oxide;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2005.1563280
Filename
1563280
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