• DocumentCode
    772768
  • Title

    Influence of material parameters on acoustic wave propagation modes in ZnO/Si bi-layered structures

  • Author

    Gao, Hui-dong ; Zhang, Shu-yi ; Qi, Xue ; Wasa, Kiyotaka ; Wu, Hao-dong

  • Author_Institution
    Lab. of Modern Acoust., Nanjing Univ., China
  • Volume
    52
  • Issue
    12
  • fYear
    2005
  • Firstpage
    2361
  • Lastpage
    2369
  • Abstract
    The influences of material properties on acoustic wave propagation modes in ZnO/Si bi-layered structures are studied. The transfer matrix method is used to calculate dispersion relations, wave field distributions, and electromechanical coupling coefficients of acoustic wave propagation modes in ZnO/Si bi-layered systems, in which the thickness of the substrate is of the same order of magnitude as the wavelength of the propagating wave modes. The influences of the thin film parameters on the acoustic wave propagation modes and their electromechanical coupling coefficients of the wave modes also are obtained. In addition, some experimental results for characterizing the wave propagation modes and their frequencies have also been obtained, which agree well with the theoretical predictions.
  • Keywords
    II-VI semiconductors; acoustic wave effects; elemental semiconductors; piezoelectric semiconductors; piezoelectric thin films; piezoelectricity; silicon; transfer function matrices; zinc compounds; Si; ZnO-Si; acoustic wave propagation modes; bilayered structures; dispersion relations; electromechanical coupling coefficients; transfer matrix method; wave field distributions; Acoustic materials; Acoustic propagation; Acoustic waves; Dispersion; Frequency; Micromechanical devices; Piezoelectric films; Substrates; Transistors; Zinc oxide; Acoustics; Computer Simulation; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Materials Testing; Models, Chemical; Radiation Dosage; Radiometry; Silicon; Transducers; Ultrasonography; Zinc Oxide;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2005.1563280
  • Filename
    1563280