Title :
Silicon-based fabrication process for production of optical waveguides
Author :
Johnston, I.R. ; Parker, G.J.
Author_Institution :
Dept. of Electron., Southampton Univ., UK
fDate :
2/1/1996 12:00:00 AM
Abstract :
The fabrication of silicon waveguides for use as optical interconnects in silicon optoelectronic integrated circuits for wavelengths beyond 1.1 μm is described. The process does not require silicon-on-insulator technology, and only uses VLSI processing techniques. Long, thin mesas are etched from a silicon substrate and masked along their sides with silicon nitride. The ridges are then isotropically dry etched to undercut the walls. The remaining silicon is thermally oxidised to leave a single-crystal silicon core encased in silicon dioxide. The cross-sectional area of the silicon cores is determined by the anisotropic silicon etch and the oxidation time. Waveguides with dimensions six by four microns surrounded by a micron-thick oxide layer have been fabricated. Results of launching light of wavelength 1.5 μm into this structure show that it is suitable for optical interconnect applications
Keywords :
VLSI; elemental semiconductors; etching; integrated optoelectronics; optical fabrication; optical interconnections; optical waveguides; ridge waveguides; silicon; silicon compounds; 1 mum; 1.1 mum; 4 mum; 6 mum; Si; Si waveguides; Si-SiO2; VLSI processing techniques; cross-sectional area; etching; fabrication process; isotropic dry etching; optical interconnect applications; optical interconnects; optoelectronic integrated circuits; oxidation time; thin mesas;
Journal_Title :
Optoelectronics, IEE Proceedings -
DOI :
10.1049/ip-opt:19960133