DocumentCode
772833
Title
Order-of-magnitude improvement in microwave power capacity of InGaP/GaAs HBT under isothermal pulsed operation
Author
Halder, Subrata ; Hwang, James C M ; Solomon, George A. ; Klein, Gerald
Author_Institution
Lehigh Univ., Bethlehem, PA
Volume
53
Issue
10
fYear
2006
Firstpage
2634
Lastpage
2639
Abstract
Order-of-magnitude improvement in power capacity was achieved in single-finger heterojunction bipolar transistors with sub-mus pulses and less than 1% duty cycle, thereby approaching isothermal operation. At 6 GHz, the output power capacity was 14 mw/mum2, which was much higher than the common benchmark of 1 mw/mum2. The improvement in power capacity was found to be due to increased breakdown voltage as well as increased peak current under pulsed operation. The increased peak current was in turn due to a much higher Kirk threshold under isothermal operation
Keywords
gallium arsenide; heterojunction bipolar transistors; indium compounds; semiconductor device breakdown; 6 GHz; HBT; InGaP-GaAs; Kirk threshold; breakdown voltage; increased peak current; isothermal pulsed operation; load-pull measurement; microwave power capacity; order-of-magnitude improvement; pulsed measurement; radiofrequency power; single-finger heterojunction bipolar transistors; Gallium arsenide; Heterojunction bipolar transistors; Isothermal processes; Kirk field collapse effect; Microwave measurements; Power generation; Power measurement; Pulse measurements; Radio frequency; Thermal resistance; Harmonic; RF power; heterojunction bipolar transistor (HBT); load–pull measurement; microwave power; pulsed measurement; pulsed operation; waveform;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2006.882045
Filename
1705120
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