DocumentCode :
772833
Title :
Order-of-magnitude improvement in microwave power capacity of InGaP/GaAs HBT under isothermal pulsed operation
Author :
Halder, Subrata ; Hwang, James C M ; Solomon, George A. ; Klein, Gerald
Author_Institution :
Lehigh Univ., Bethlehem, PA
Volume :
53
Issue :
10
fYear :
2006
Firstpage :
2634
Lastpage :
2639
Abstract :
Order-of-magnitude improvement in power capacity was achieved in single-finger heterojunction bipolar transistors with sub-mus pulses and less than 1% duty cycle, thereby approaching isothermal operation. At 6 GHz, the output power capacity was 14 mw/mum2, which was much higher than the common benchmark of 1 mw/mum2. The improvement in power capacity was found to be due to increased breakdown voltage as well as increased peak current under pulsed operation. The increased peak current was in turn due to a much higher Kirk threshold under isothermal operation
Keywords :
gallium arsenide; heterojunction bipolar transistors; indium compounds; semiconductor device breakdown; 6 GHz; HBT; InGaP-GaAs; Kirk threshold; breakdown voltage; increased peak current; isothermal pulsed operation; load-pull measurement; microwave power capacity; order-of-magnitude improvement; pulsed measurement; radiofrequency power; single-finger heterojunction bipolar transistors; Gallium arsenide; Heterojunction bipolar transistors; Isothermal processes; Kirk field collapse effect; Microwave measurements; Power generation; Power measurement; Pulse measurements; Radio frequency; Thermal resistance; Harmonic; RF power; heterojunction bipolar transistor (HBT); load–pull measurement; microwave power; pulsed measurement; pulsed operation; waveform;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2006.882045
Filename :
1705120
Link To Document :
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