Title :
Influence of surface roughness of Bragg reflectors on resonance characteristics of solidly-mounted resonators
Author :
Chung, Chung-Jen ; Chen, Ying-Chung ; Cheng, Chien-Chuan ; Wei, Ching-Liang ; Kao, Kuo-Sheng
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
fDate :
4/1/2007 12:00:00 AM
Abstract :
The solidly mounted resonator (SMR) is fabricated using planar processes from a piezoelectric layer sandwiched between two electrodes upon Bragg reflectors, which then are attached to a substrate. To transform the effective acoustic impedance of the substrate to a near zero value, the Bragg reflectors are composed of alternating high and low acoustic impedance layers of quarter-wavelength thickness. This paper presents the influence of Bragg reflector surface roughness on the resonance characteristics of a SMR. Originally, an AlN/Al multilayer is used as the Bragg reflector. The poor surface roughness of this Bragg reflector results in a poor SMR frequency response. To improve the surface roughness of Bragg reflectors, a molybdenum (Mo)/titanium (Ti) multilayer with a similar coefficient of thermal expansion is adopted. By controlling deposition parameters, the surface roughness of the Bragg reflector is improved, and better resonance characteristics of SMR are obtained
Keywords :
acoustic impedance; acoustic resonators; bulk acoustic wave devices; metallic thin films; molybdenum; multilayers; piezoelectric thin films; sputter deposition; surface roughness; thermal expansion; titanium; Bragg reflectors; Mo-Ti; acoustic impedance; coefficient of thermal expansion; electrodes; magnetron sputtering; multilayer; piezoelectric layer; solidly-mounted resonators; substrate; surface roughness; Electrodes; Nonhomogeneous media; Radio frequency; Resonance; Rough surfaces; Semiconductor thin films; Sputtering; Substrates; Surface impedance; Surface roughness;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2007.313