Title :
Study of enhanced bit error rate and "bit skipping" due to parasitic coupling in vertical-cavity surface-emitting laser arrays
Author :
Riyopoulos, Spilios
Author_Institution :
Sci. Applic. Int. Corp., McLean, VA, USA
Abstract :
Cavity interactions due to lateral fringe field overlap or "stray" reflections from optical elements in a vertical-cavity surface-emitting laser (VCSEL) array based interconnects are studied. Interacting cavity pairs act as coupled oscillators. Depending on the bit sequence the cavity that switches on first acts as a master oscillator that affects the switch on jitter for the other. Earlier analytic formalism for the bit error rate (BER) is extended to include the influence of the cavity coupling strength on the switch on jitter. Analytic results, including pre-biasing, demonstrate the potential for a large degradation in BER at small coupling strengths, if anti-phasing develops during bit coupling. Numerical results show that extreme cases result into complete pulse suppression (bit skipping). On the other hand, achieving in-phase coupling among bits improves BER.
Keywords :
delays; jitter; optical communication equipment; semiconductor laser arrays; semiconductor lasers; surface emitting lasers; anti-phasing; bit error rate; bit sequence; bit skipping; cavity coupling strength; cavity pairs; coupled oscillators; enhanced bit error rate; in-phase coupling; master oscillator; parasitic coupling; pulse suppression; small coupling strengths; stray reflections; vertical-cavity surface-emitting laser arrays; Bit error rate; Jitter; Optical arrays; Optical coupling; Optical interconnections; Optical reflection; Optical switches; Oscillators; Surface emitting lasers; Vertical cavity surface emitting lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2003.816089