Title :
Hankel transform-domain analysis of scattered fields in multilayer planar waveguides and lasers with circular gratings
Author :
Shams-Zadeh-Amiri, Ali M. ; Li, Xun ; Huang, Wei-Ping
Author_Institution :
Univ. of Waterloo, Ont., Canada
Abstract :
Radiation patterns of scattered fields with arbitrary azimuthal orders in multilayer planar waveguides and laser cavities with circularly symmetric gratings are formulated based on the volume current method. Full-wave Green´s function analysis based on the integral transform method lies at the heart of this approach. Unlike the conventional approach, the dyadic Green´s function relates some auxiliary fields to some auxiliary sources in the spectral domain. These auxiliary functions are defined to facilitate the spectral domain formulation in the cylindrical coordinate system and the use of transfer matrix method for obtaining a closed-form solution of the spectral Green´s function in multilayer planar structures. More importantly, it is shown that the far-field pattern of the scattered field can be expressed directly in terms of the auxiliary fields in the Hankel transform domain.
Keywords :
Green´s function methods; Hankel transforms; diffraction gratings; distributed Bragg reflector lasers; laser cavity resonators; light scattering; matrix algebra; optical multilayers; optical planar waveguides; optical waveguide theory; semiconductor lasers; Hankel transform domain; Hankel transform-domain analysis; arbitrary azimuthal orders; auxiliary fields; circular grating lasers; circularly symmetric gratings; full-wave Green´s function analysis; integral transform method; laser cavities; multilayer planar waveguides; radiation patterns; scattered fields; spectral Green´s function; spectral domain formulation; transfer matrix method; Distributed Bragg reflectors; Distributed feedback devices; Gratings; Laser modes; Nonhomogeneous media; Optical scattering; Optical waveguides; Planar waveguides; Surface emitting lasers; Waveguide lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2003.816097