DocumentCode :
77301
Title :
A High Frame Rate Hybrid X-Ray Image Sensor
Author :
Ercan, Alper ; Tate, Mark W. ; Gruner, Sol M.
Author_Institution :
Cornell Univ., Ithaca, NY, USA
Volume :
15
Issue :
3
fYear :
2015
fDate :
Mar-15
Firstpage :
1523
Lastpage :
1531
Abstract :
This paper describes a solid-state image sensor for high-speed X-ray imaging. The sensor is made up of a light sensitive detector layer bump-bonded to a readout integrated circuit (ROIC). The detector layer is high resistivity n-type silicon and is fully depleted in operation. The p-implanted islands are used to define pixel regions with 100-μm × 100-μm area. The detector layer contains 852 × 209 pixels indium bump-bonded to four identical CMOS ROICs. Each ROIC contains 213 × 209 pixels and is fabricated using a 0.25-μm CMOS process. The ROIC utilizes a capacitive transimpedance amplifier-type front-end coupled to a switched capacitor analog memory. This architecture allows storage of eight frames for high-speed burst imaging of up to a million frames per second, followed by a slower multiplexed readout. Details of the sensor design and operation are presented together with characterization results.
Keywords :
CMOS image sensors; X-ray detection; X-ray imaging; analogue storage; capacitive sensors; elemental semiconductors; integrated circuit bonding; ion implantation; operational amplifiers; readout electronics; silicon; switched capacitor networks; Si; bump-bonding; capacitive transimpedance amplifier-type front-end coupling; high frame rate hybrid X-ray image sensor; high resistivity n-type silicon detector layer; high-speed X-ray imaging; high-speed burst imaging; identical CMOS ROIC; light sensitive detector layer; p-implanted island; readout integrated circuit; size 0.25 mum; solid-state image sensor; switched capacitor analog memory; CMOS integrated circuits; Computer architecture; Detectors; Noise; Photonics; Transistors; CMOS; High-speed image sensor; ROIC; X-ray sensor; hybrid image sensor;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2014.2359153
Filename :
6905719
Link To Document :
بازگشت