Title :
A Beam Profile Indicator with Solid State Detectors
Author :
Tepper, Luis ; Miller, G.L. ; Kycia, T.
Author_Institution :
Brookhaven National Laboratory Upton, N. Y.
fDate :
6/1/1964 12:00:00 AM
Abstract :
The instrument described in this paper was built with the purpose of providing a display of the profile of secondary beams from high energy accelerators. It is capable of handling 105 particles per cm2 per machine pulse, assuming a 20 msec spill. The profile is measured by an array of 32 semiconductor detectors, 4 nm apart and arranged in the form of a cross. The detectors count the individual impinging particles. The total numbers of counts on each detector are fed continuously to a multichannel scaler, which in turn delivers an analogue live display and a digital printout. Details of the electronics and methods of fabrication of the detectors, as well as their problems, are discussed.
Keywords :
Atomic measurements; Detectors; Displays; Laboratories; Molecular beam epitaxial growth; Particle beam measurements; Particle beams; Sensor arrays; Solid state circuits; Sparks;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1964.4323459