• DocumentCode
    773121
  • Title

    Vacuum-Assisted Microfluidic Technique for Fabrication of Guided Wave Devices

  • Author

    Flores, Angel ; Song, Sangyup ; Baig, Sarfaraz ; Wang, Michael R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Miami Univ., Coral Gables, FL
  • Volume
    20
  • Issue
    14
  • fYear
    2008
  • fDate
    7/15/2008 12:00:00 AM
  • Firstpage
    1246
  • Lastpage
    1248
  • Abstract
    We report on a novel vacuum-assisted microfluidic (VAM) technique for guided wave device fabrication. Ultraviolet curable resins were used to demonstrate the effective VAM waveguide fabrication. Comparisons to a conventional soft molding technique demonstrate that the VAM approach results in lower propagation losses, lower crosstalk, and improved waveguide structures. More importantly, microscope analysis portrays improved device formation, sidewall edges, and the elimination of the polymer background residue inherent to traditional soft molding fabrication techniques. As a low-cost rapid prototyping technique, the VAM soft lithographic method allows guided wave devices to be implemented rapidly and inexpensively.
  • Keywords
    integrated optics; micro-optomechanical devices; microfluidics; optical crosstalk; optical fabrication; optical losses; optical polymers; optical waveguides; photolithography; resins; soft lithography; VAM soft lithographic method; guided wave device fabrication; low-cost rapid prototyping technique; microscope analysis; optical crosstalk; polymer background residue; propagation losses; sidewall edges; ultraviolet curable resins; vacuum-assisted microfluidic technique; waveguide fabrication; Microfluidics; Optical crosstalk; Optical device fabrication; Optical devices; Optical interconnections; Optical polymers; Optical waveguides; Resins; Soft lithography; Vacuum technology; Integrated optics; microfluidics; soft-lithography; waveguides;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2008.926022
  • Filename
    4550602