• DocumentCode
    773462
  • Title

    Trends and challenges in VLSI circuit reliability

  • Author

    Constantinescu, Cristian

  • Volume
    23
  • Issue
    4
  • fYear
    2003
  • Firstpage
    14
  • Lastpage
    19
  • Abstract
    Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.
  • Keywords
    VLSI; fault tolerance; integrated circuit reliability; VLSI; circuit reliability; deep-submicron technology; faults; intermittent faults; permanent faults; transient faults; Circuit faults; Copper; Electromigration; Frequency; Integrated circuit interconnections; Microprocessors; Random access memory; Semiconductor device manufacture; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2003.1225959
  • Filename
    1225959
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=773462