DocumentCode :
773463
Title :
A Local Passive Time Interpolation Concept for Variation-Tolerant High-Resolution Time-to-Digital Conversion
Author :
Henzler, Stephan ; Koeppe, Siegmar ; Lorenz, Dominik ; Kamp, Winfried ; Kuenemund, Ronald ; Schmitt-Landsiedel, Doris
Author_Institution :
Adv. Syst. & Circuits Dept., Infineon Technol. AG, Munich
Volume :
43
Issue :
7
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
1666
Lastpage :
1676
Abstract :
Time-to-digital converters (TDCs) are promising building blocks for the digitalization of mixed-signal functionality in ultra-deep-submicron CMOS technologies. A short survey on state-of-the-art TDCs is given. A high-resolution TDC with low latency and low dead-time is proposed, where a coarse time quantization derived from a differential inverter delay-line is locally interpolated with passive voltage dividers. This high-resolution TDC is monotonic by construction which makes the concept very robust against process variations. The feasibility is demonstrated by a 90 nm demonstrator which uses a 4x interpolation and provides a time domain resolution of 4.7 ps. An integral nonlinearity of 1.2 LSB and a differential nonlinearity of 0.6 LSB are achieved. The resolution restrictions imposed by an uncertainty of the stop signal and local variations are derived theoretically.
Keywords :
CMOS integrated circuits; analogue-digital conversion; interpolation; mixed analogue-digital integrated circuits; coarse time quantization; differential inverter delay-line; differential nonlinearity; digital PLL; digital calibration; high-resolution time interval measurement; integral nonlinearity; local passive time interpolation concept; local variations; mixed-signal functionality; passive voltage dividers; process variations; pulse shrinking; stop signal; time 4.7 ps; time-to-digital converters; ultra-deep-submicron CMOS technologies; variation-tolerant high-resolution time-to-digital conversion; CMOS technology; Circuits; Delay; Interpolation; Phase locked loops; Phase measurement; Signal resolution; Signal to noise ratio; Velocity measurement; Voltage; Digital calibration; Vernier TDC; digital PLL; high-resolution time interval measurement; passive time interpolation; pulse shrinking; time-to-digital converter (TDC);
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2008.922712
Filename :
4550638
Link To Document :
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