DocumentCode

773511

Title

The use and abuse of SPEC: An ISCA panel

Author

Hennessy, John ; Citron, Daniel ; Patterson, Dean

Author_Institution

Stanford University

Volume

23

Issue

4

fYear

2003

Firstpage

73

Lastpage

77

Keywords

Aggregates; Electric breakdown; Multithreading;

fLanguage

English

Journal_Title

Micro, IEEE

Publisher

ieee

ISSN

0272-1732

Type

jour

DOI

10.1109/MM.2003.1225977

Filename

1225977