Static capacitance of some multilayered microstrip capacitors

Author

Verma, Anand K. ; Rostamy, Zargham

Author_Institution

Dept. of Electron. Sci., Delhi Univ., India

Volume

43

Issue

5

fYear

1995

fDate

5/1/1995 12:00:00 AM

Firstpage

1144

Lastpage

1152

Abstract

A new unified model, the modified Wolff model (MWM) is presented to determine the lumped capacitance of rectangular, circular, hexagonal and triangular patches on the single layer substrate and under the multilayer condition. Effect of the top shield on the lumped capacitance has also been determined. The MWM is the combination of Wolff-Knoppick model, TTL technique and single layer reduction (SLR) technique, The results of MWM have been compared against the results of SDA, FEM, dual integral method and other forms of the variational methods with accuracy between 0.5-5% for most shapes under various conditions. The present model has accuracy of SDA and other rigorous formulations. No single method has been used in the literature to determine the lumped capacitance of patches of several shapes under the multilayer and shielded condition. The MWM is fast even on the desktop computer. Thus, the model is suitable for a unified CAD for the MMIC applications

Keywords

MMIC; capacitance; circuit CAD; integrated circuit design; lumped parameter networks; microstrip circuits; MMIC applications; Wolff-Knoppick model; lumped capacitance; modified Wolff model; multilayered microstrip capacitors; patches; shielded condition; single layer reduction; static capacitance; top shield; unified CAD; variational methods; Application software; Capacitance; Capacitors; Helium; MMICs; Microstrip; Microwave integrated circuits; Nonhomogeneous media; Shape; Transmission line matrix methods;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.382078

Filename

382078