• DocumentCode
    773747
  • Title

    Memory effects in EM emission during uniaxial deformation of dielectric Crystalline materials

  • Author

    Hadjicontis, Vassilios ; Tombras, George S. ; Ninos, Dimitrios ; Mavromatou, Clairi

  • Author_Institution
    Dept. of Phys., Univ. of Athens, Greece
  • Volume
    2
  • Issue
    2
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    118
  • Lastpage
    120
  • Abstract
    It is known that during uniaxial compression of dielectric crystalline materials, acoustic and electromagnetic (EM) emission is detected. Such emissions are of particular interest, since they are related to the physical processes taking place during the preparation stage of an earthquake. In this letter, we report recent experimental results on the memory effects observed in the EM emission during successive cyclic mechanical loading-unloading of LiF crystal samples in a similar fashion, as it has been described by the so-called "Kaiser effect," i.e., the memory effect for the acoustic emission, and we discuss on a conceptual explanation.
  • Keywords
    acoustic emission; dielectric materials; earthquakes; electromagnetic waves; microcracks; Kaiser effect; LiE crystal samples; acoustic emission; dielectric crystalline materials; earthquake precursors; electromagnetic emission; memory effects; microfracturing electrification; successive cyclic mechanical loading-unloading; uniaxial compression; uniaxial deformation; Acoustic emission; Acoustic materials; Acoustic signal detection; Crystalline materials; Dielectrics; Earthquakes; Instruments; Laboratories; Physics; Tensile stress; “Kaiser effect”; Acoustic emission; earthquake precursors; electromagnetic (EM) emission; microfracturing electrification;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2004.842472
  • Filename
    1420286