Linear dependencies in extended LFSMs

Author

Kagaris, Dimitri

Author_Institution

Dept. of Electr & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA

Volume

21

Issue

7

fYear

2002

fDate

7/1/2002 12:00:00 AM

Firstpage

852

Lastpage

859

Abstract

In this paper, the linear dependencies of extended linear finite state machines (LFSMs) used as test pattern generators (TPGs) are examined. The TPG mechanism considered is a shift register whose initial portion is configured as an LFSM. This mechanism (LFSM/SR) can be used for pseudorandom and circuit-specific pseudoexhaustive test pattern generation. A formula is presented that relates the linear dependencies that can occur among the LFSM/SR cells with the characteristic polynomial of the LFSM. Previously, such an easily computable formula had only been established for Type-1 linear feedback shift registers (LFSRs). The generalization allows the fast determination of linear dependencies for any LFSM, including in particular Type-2 LFSRs and cellular automata

Keywords

built-in self test; cellular automata; circuit feedback; finite state machines; shift registers; built-in self-test; cellular automata; extended linear finite state machine; linear dependence; linear feedback shift register; shift register; test pattern generator; Automatic testing; Built-in self-test; Circuit testing; Hardware; Linear feedback shift registers; Polynomials; Shift registers; Strontium; System testing; Test pattern generators;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2002.1013897

Filename

1013897